Calculation Methodology


:: Overview

:: Calculation Methodology

:: Reliability Trend Charts

:: Reliability Data

Volterra Long-Term Reliability Modeling

Long-term reliability is estimated from accelerated testing of product. At Volterra we dynamically stress our product consistent with JESD22-A108 at 125°C ambient temperature and maximum supply voltage. 

Reliability estimates assume an activation energy of 0.7eV for the failure mechanism, and utilize temperature acceleration. Voltage Acceleration Factor is only used when VDDH -Max > 110% of VNOMINAL.

FIT Rate (failures in 1E9 hours) is estimated from the number of accelerated life test failures, the total device-hours at stress temperature, temperature acceleration factor (stress temperature to application temperature) and voltage acceleration factor. The chi-square estimate is calculated at 60% confidence and consistent with JESD85.

Rel_Formulae

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