Reliability


:: Overview

:: Calculation Methodology

:: Reliability Trend Charts

:: Reliability Data

Overview

The reliability of all Volterra products is assured through rigorous qualification and appropriate Ongoing Reliability Monitoring (ORM). Each new product at Volterra is subject to the qualification requirements as stipulated in SOP-QR-0022. In addition, key products are chosen as representative of various product families or process technologies and subjected to Ongoing Reliability Monitoring. For device reliability, a key metric is the Long Term Failure Rate, expressed in Failures In Time (FIT rate = the predicted number of failures in a billion device-hours of operation at 55ºC junction temperature). (See the Calculation Methodology section section for more information.) The High Temperature Operation Life (HTOL) data allows us to estimate the reliability of Volterra products, uncover potential reliability failure mechanisms and drive continuous improvement in the manufacturing operations.

As part of the qualification process, package reliability is also assessed via appropriate environmental stress tests.

The following tables provide statistics for Volterra's product and package reliability tests.

Table of Reliability Tests

Reliability Stress TestApplicable StandardStress Conditions
High Temperature Operation Life (HTOL)JESD22-A108

TA = 125°C
VDDH = 14.0 Volts
VDD/VCC = 3.63 Volts

Preconditioning Prior to
TC, HTS, and HAST

JESD22-A113

IR Re-Flow @ 260°C

Temperature Cycling (TC) JESD22-A104

Condition B
-55°C to 125°C

High Temp Storage (HTS)

JESD22-A103

Condition B
150°C

Highly Accelerated Stress Test (HAST)

JESD22-A110

Precondition
130°C, 2 ATM, 85% RH,
VDDH = 10 Volts

For more information about Volterra's reliability processes and procedures, please contact quality@volterra.com.

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